Abhee 1, L.P.
2Patents
1Active
2Granted
27Portfolio score
Filing activity: Jan 12, 2009 → Apr 7, 2010 · 1 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7804294B1 | Non contact method and apparatus for measurement of sheet resistance of P-N junctions | Physics | 2 | Active |
| USD645768S1 | Junction photovoltage probe face | General | 0 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.