Abound Limited
1Patents
1Active
1Granted
36Portfolio score
Filing activity: Jul 27, 2007 → Jul 27, 2007
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8580696B2 | Systems and methods for detecting watermark formations on semiconductor wafers | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.