Accelrys Inc.
🏢 View company profile →6Patents
0Active
6Granted
24Portfolio score
Filing activity: Sep 4, 1998 → May 2, 2003
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6582233B1 | Apparatus and method for monitoring the validity of a molecular model | Physics | 9 | Expired |
| US6741937B2 | Methods and systems for estimating binding affinity | Physics | 4 | Expired |
| US6460014B1 | Modeling interactions with atomic parameters including anisotropic dipole polarizability | Physics | 4 | Expired |
| US6758677B2 | Apparatus and method for monitoring the validity of a molecular model | Physics | 1 | Expired |
| US6438204B1 | Linear prediction of structure factors in x-ray crystallography | Physics | 0 | Expired |
| US6438205B1 | System and method for reducing phase ambiguity of crystal structure factors | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.