HENDRY MECHANICAL WORKS
21Patents
0Active
21Granted
34Portfolio score
Filing activity: Sep 16, 1988 → Jun 7, 2002
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6561602B1 | Equipment mounting racks and cabinets | Electricity | 72 | Expired |
| US6527351B1 | Equipment mounting racks and cabinets | Electricity | 66 | Expired |
| US5477150A | Electric arc and radio frequency spectrum detection | Physics | 55 | Expired |
| US6006925A | Equipment rack system | Electricity | 55 | Expired |
| US5574251A | Electrical and electronic cabinet systems | Electricity | 48 | Expired |
| US4983955A | Electric power supply circuit monitoring systems | Electricity | 42 | Expired |
| US5004107A | Earthquake braced racks | Electricity | 41 | Expired |
| US5373241A | Electric arc and radio frequency spectrum detection | Physics | 33 | Expired |
| US6707688B2 | Electric apparatus with electric terminals and fused structures | Electricity | 20 | Expired |
| US5363613A | Rigid supporting structures | Mechanical Engineering; Lighting; Heating | 19 | Expired |
| US6772077B1 | Electric arc monitoring systems | Physics | 17 | Expired |
| US4853820A | Electronic circuit breaker systems | Electricity | 15 | Expired |
| US6229707A | Calamity-proof electrical equipment cabinet door systems | Electricity | 15 | Expired |
| US6859042B2 | Arc detection by non-causal signal correlation | Electricity | 15 | Expired |
| US6362629B1 | Electric arc monitoring systems | Physics | 13 | Expired |
| US6400258B1 | Electric arc monitoring systems | Physics | 12 | Expired |
| US6781381B2 | Electric arc synthesis for arc detector testing and method for arc testing | Physics | 7 | Expired |
| US6747459B2 | Electric arc monitoring systems | Physics | 6 | Expired |
| US6356450B1 | Circuit board holders and assemblies | Electricity | 5 | Expired |
| US6402572B1 | Electric switching device assembly system | Emerging Cross-Sectional Technologies | 4 | Expired |
| US6133739A | Electric battery monitoring systems | Physics | 3 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.