IC Mems, Inc.
1Patents
0Active
1Granted
21Portfolio score
Filing activity: Apr 18, 2002 → Apr 18, 2002
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6724204B2 | Probe structure for testing semiconductor devices and method for fabricating the same | Physics | 6 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.