JMIC, Inc.
2Patents
0Active
2Granted
21Portfolio score
Filing activity: Feb 23, 2001 → Oct 17, 2002
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6679093B2 | Method of calibration using analytical apparatus for measurement of low concentration constituent | Physics | 6 | Expired |
| US6526811B2 | Analytical apparatus for measurement of low concentration constituent, method of measurement and calibration using the same | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.