Metron Systems, Inc.
6Patents
0Active
6Granted
26Portfolio score
Filing activity: Aug 3, 2000 → Oct 29, 2003
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6822748B2 | Calibration for 3D measurement system | Physics | 16 | Expired |
| US6940891B2 | High precision optical imaging systems and related systems | Physics | 15 | Expired |
| US6441908B1 | Profiling of a component having reduced sensitivity to anomalous off-axis reflections | Physics | 15 | Expired |
| US6825922B2 | Determination of the angular position of a laser beam | Physics | 3 | Expired |
| US6870631B2 | Profiling of a component having reduced sensitivity to anomalous off-axis reflections | Physics | 2 | Expired |
| US6785007B2 | Profiling of a component having reduced sensitivity to anomalous off-axis reflections | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.