NECTECH COMPANY LIMITED
1Patents
1Active
1Granted
39Portfolio score
Filing activity: Jun 29, 2015 → Jun 29, 2015
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9947067B2 | Radiation image inspection system and method based on B/S architecture | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.