Numetrix Ltd.
1Patents
0Active
1Granted
27Portfolio score
Filing activity: Feb 21, 1995 → Feb 21, 1995
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5539517A | Method for simultaneously measuring the spectral intensity as a function of wavelength of all the pixels of a two dimensional scene | Physics | 193 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.