Opan Technologies Ltd.
1Patents
0Active
1Granted
24Portfolio score
Filing activity: Dec 27, 1995 → Dec 27, 1995
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5644132A | System for high resolution imaging and measurement of topographic and material features on a specimen | Electricity | 61 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.