Optoscan Corporation
1Patents
0Active
1Granted
24Portfolio score
Filing activity: Mar 12, 1985 → Mar 12, 1985
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4656358A | Laser-based wafer measuring system | Physics | 38 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.