QuanTech, Inc.
2Patents
0Active
2Granted
22Portfolio score
Filing activity: Oct 3, 2000 → Nov 26, 2003
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7038446B1 | Dual coil probe for detecting geometric differences while stationary with respect to threaded apertures and fasteners or studs | Physics | 8 | Expired |
| US6703831B1 | Dual eddy current probe for detecting geometrical differences especially as related to threaded apertures and studs | Physics | 5 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.