Sensor Control, Inc.
1Patents
0Active
1Granted
20Portfolio score
Filing activity: Sep 10, 1987 → Sep 10, 1987
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4823291A | Radiometric measurement of wafer temperatures during deposition | Physics | 15 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.