Technokom-Centre Advanced Technology
1Patents
0Active
1Granted
23Portfolio score
Filing activity: Jul 12, 2002 → Jul 12, 2002
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6662631B2 | Method and apparatus for characterization of porous films | Physics | 25 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.