Adam E. Norton
51Patents
12h-index
47Co-inventors
84Inventor score
Filing activity: Mar 28, 1994 → Oct 18, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5486701A | Method and apparatus for measuring reflectance in two wavelength bands to enable determination of thin film thickness | Physics | 317 | Expired |
| US5859424A | Apodizing filter system useful for reducing spot size in optical measurements and other applications | Physics | 257 | Expired |
| US5747813A | Broadband microspectro-reflectometer | Physics | 162 | Expired |
| US5917594A | Spectroscopic measurement system using an off-axis spherical mirror and refractive elements | Physics | 106 | Expired |
| US6184984A | System for measuring polarimetric spectrum and other properties of a sample | Physics | 87 | Expired |
| US6611330B2 | System for measuring polarimetric spectrum and other properties of a sample | Physics | 83 | Expired |
| US6753961B1 | Spectroscopic ellipsometer without rotating components | Physics | 72 | Expired |
| US6323946A | Spectroscopic measurement system using curved mirror | Physics | 28 | Expired |
| US8233148B2 | Hyperspectral imaging systems | Physics | 28 | Active |
| US6778273B2 | Polarimetric scatterometer for critical dimension measurements of periodic structures | Physics | 27 | Expired |
| US7304735B2 | Broadband wavelength selective filter | Physics | 21 | Expired |
| US7145654B2 | Method and apparatus to reduce spotsize in an optical metrology instrument | Physics | 20 | Expired |
| US6677602B1 | Notch and flat sensor for wafer alignment | Physics | 12 | Expired |
| US9915823B1 | Lightguide optical combiner for head wearable display | Physics | 12 | Active |
| US6583877B2 | Spectroscopic measurement system using an off-axis spherical mirror and refractive elements | Physics | 10 | Expired |
| US7081957B2 | Aperture to reduce sensitivity to sample tilt in small spotsize reflectometers | Physics | 9 | Expired |
| US7660696B1 | Apparatus for auto focusing a workpiece using two or more focus parameters | Physics | 8 | Active |
| US7289219B2 | Polarimetric scatterometry methods for critical dimension measurements of periodic structures | Physics | 8 | Expired |
| US7961306B2 | Optimizing sensitivity of optical metrology measurements | Physics | 8 | Active |
| US6667805B2 | Small-spot spectrometry instrument with reduced polarization | Physics | 7 | Expired |
| US6909507B2 | Polarimetric scatterometry methods for critical dimension measurements of periodic structures | Physics | 7 | Expired |
| US8917459B2 | Ergonomic vertical vision redirection | Physics | 6 | Active |
| US9626145B1 | Tileable display with pixel-tape | Physics | 6 | Active |
| US9336729B2 | Optical configurations in a tileable display apparatus | Physics | 5 | Active |
| US7099081B2 | Small-spot spectrometry instrument with reduced polarization and multiple-element depolarizer therefor | Physics | 5 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.