Inventor · Lake Bluff, IL, US

Adam Petschke

13Patents
3h-index
8Co-inventors
42Inventor score

Filing activity: Aug 7, 2013 → Feb 17, 2017

Most-cited inventions

PatentTitleAreaCited byStatus
US9977140B2 More efficient method and apparatus for detector response correction and material decomposition of projection data obtained using photon-counting detectors Physics 7 Active
US9256938B2 Characteristic X-ray escape correction in photon-counting detectors Physics 5 Active
US9687207B2 Pre-reconstruction calibration, data correction, and material decomposition method and apparatus for photon-counting spectrally-resolving X-ray detectors and X-ray imaging Physics 3 Active
US9449385B2 Reconstruction of computed tomography images using combined third-generation and fourth-generation projection data Physics 3 Active
US9155515B2 Registration of 4th generation detectors relative to the 3rd generation CT system coordinates using 4th generation sinogram data Human Necessities 2 Active
US9345445B2 Registration of 4th-generation detectors relative to 3rd-generation CT system coordinates using 4th-generation detector shadow pattern Physics 2 Active
US9437016B2 Image domain pansharpening method and system for spectral CT with large pixel energy discriminating detectors Physics 2 Active
US10499869B2 Apparatus and method for material decomposition of spectrally resolved projection data using singles counts Physics 1 Active
US10716527B2 Combined sinogram- and image-domain material decomposition for spectral computed tomography (CT) Physics 1 Active
US10176603B2 Sinogram (data) domain pansharpening method and system for spectral CT Physics 1 Active
US9761019B2 Computed tomography using simultaneous image reconstruction with measurements having multiple distinct system matrices Physics 1 Active
US9459358B2 Reference calibration in photon counting based spectral CT Physics 1 Active
US9672638B2 Spectral X-ray computed tomography reconstruction using a vectorial total variation Physics 1 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.