Alberto Santoni
1Patents
1h-index
4Co-inventors
25Inventor score
Filing activity: May 30, 2002 → May 30, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6985229B2 | Overlay metrology using scatterometry profiling | Physics | 32 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.