Alexander Chereshnya
2Patents
1h-index
7Co-inventors
30Inventor score
Filing activity: Mar 27, 2020 → Apr 26, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11348224B2 | Mask inspection of a semiconductor specimen | Physics | 1 | Active |
| US11983867B2 | Mask inspection of a semiconductor specimen | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.