Ayham Nseir
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Jul 2, 2010 → Jul 2, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8736683B2 | Method for estimating a defect in an image-capturing system, and associated systems | Electricity | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.