Ayumu Ishihara
7Patents
2h-index
10Co-inventors
44Inventor score
Filing activity: Mar 2, 2010 → Mar 16, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8208356B2 | Optical checking method and apparatus for defects in magnetic disks | Physics | 4 | Active |
| US9722349B2 | Wire harness | Electricity | 3 | Active |
| US8169868B2 | Method for detecting surface defects in patterned media | Physics | 1 | Active |
| US8634070B2 | Method and apparatus for optically inspecting a magnetic disk | Physics | 1 | Active |
| US8295000B2 | Method and its apparatus for inspecting a magnetic disk | Physics | 0 | Active |
| US12230932B2 | Wire harness | Electricity | 0 | Active |
| US8547547B2 | Optical surface defect inspection apparatus and optical surface defect inspection method | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.