Inventor · Eglisau, CH

Beat Emch

1Patents
1h-index
6Co-inventors
25Inventor score

Filing activity: Mar 23, 1999 → Mar 23, 1999

Most-cited inventions

PatentTitleAreaCited byStatus
US6422072B1 Device for measuring properties of a longitudinally moved specimen such as yarn Physics 1 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.