Björn Wirker
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: May 4, 2005 → May 4, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7158426B2 | Method for testing an integrated semiconductor memory | Physics | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.