Brian Kleen
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Jun 20, 2003 → Jun 20, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7149640B2 | Method and system for test data capture and compression for electronic device analysis | Physics | 6 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.