Chen Ofek
1Patents
1h-index
6Co-inventors
25Inventor score
Filing activity: Apr 1, 2004 → Apr 1, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7587700B2 | Process monitoring system and method for processing a large number of sub-micron measurement targets | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.