Chetana Bhaskar
6Patents
4h-index
56Co-inventors
60Inventor score
Filing activity: Mar 17, 1994 → Nov 30, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5502306A | Electron beam inspection system and method | Electricity | 259 | Expired |
| US8126255B2 | Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions | Physics | 146 | Active |
| US9262821B2 | Inspection recipe setup from reference image variation | Physics | 7 | Active |
| US10395358B2 | High sensitivity repeater defect detection | Emerging Cross-Sectional Technologies | 6 | Active |
| US11295438B2 | Method and system for mixed mode wafer inspection | Physics | 0 | Active |
| US10192303B2 | Method and system for mixed mode wafer inspection | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.