Christopher Pickering
2Patents
2h-index
6Co-inventors
30Inventor score
Filing activity: May 10, 1999 → Feb 22, 2001
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6726767B1 | Layer processing | Chemistry; Metallurgy | 14 | Expired |
| US6362881B1 | In-situ monitoring of electrical properties by ellipsometry | Physics | 10 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.