Inventor · Hopewell Junction, NY, US

Dan Prager

2Patents
2h-index
3Co-inventors
30Inventor score

Filing activity: Jul 8, 2004 → Jun 20, 2006

Most-cited inventions

PatentTitleAreaCited byStatus
US7065423B2 Optical metrology model optimization for process control Physics 30 Expired
US7221989B2 Optical metrology model optimization for process control Physics 9 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.