Daniel Mak
2Patents
0h-index
6Co-inventors
24Inventor score
Filing activity: Sep 18, 2018 → Oct 29, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10739382B2 | Testing apparatus having a configurable probe fixture | Physics | 0 | Active |
| US12055582B2 | Sensor device for detecting electrical defects based on resonance frequency | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.