Daniel W. Prevedel
5Patents
3h-index
11Co-inventors
46Inventor score
Filing activity: Oct 1, 1998 → Dec 17, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6720574B2 | Method of testing a semiconductor chip | Electricity | 11 | Expired |
| US7231626B2 | Method of implementing an engineering change order in an integrated circuit design by windows | Physics | 9 | Expired |
| US7898275B1 | Known good die using existing process infrastructure | Electricity | 3 | Expired |
| US7185298B2 | Method of parasitic extraction from a previously calculated capacitance solution | Physics | 3 | Expired |
| US7168055B2 | Method and apparatus for detecting nets physically changed and electrically affected by design ECO | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.