Daniel Y. Chiew
15Patents
8h-index
23Co-inventors
68Inventor score
Filing activity: Aug 6, 2007 → Dec 19, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8384730B1 | System, module, and method for generating HUD image data from synthetic vision system image data | Physics | 65 | Active |
| US9245450B1 | System, apparatus, and method for generating runway visual aids on an aircraft display unit | Physics | 29 | Active |
| US7965202B1 | System, system, module, and method for presenting an abbreviated pathway on an aircraft display unit | Physics | 26 | Active |
| US8200378B1 | System, module, and method for presenting NOTAM information on an aircraft display unit | Physics | 22 | Active |
| US8099234B1 | System, apparatus, and method for generating location information on an aircraft display unit using location markers | Physics | 17 | Active |
| US8159416B1 | Synthetic vision dynamic field of view | Physics | 11 | Active |
| US8462019B1 | Position-dependent system, apparatus, and method for generating runway visual aids presented on an aircraft display unit | Physics | 10 | Active |
| US8976042B1 | Image combining system, device, and method of multiple vision sources | Physics | 10 | Active |
| US11046452B1 | Head-up display including supplemental indicator | Physics | 2 | Active |
| US10907968B1 | Integrity monitoring systems and methods for image sensors | Electricity | 2 | Active |
| US11097851B1 | System and method to momentarily switch SVS mode | Electricity | 1 | Active |
| US11348470B1 | Apparent video brightness control and metric | Electricity | 1 | Active |
| US12038952B1 | Aerial image geo-registration via aeronautical database content as ground control points | Physics | 0 | Active |
| US10997731B2 | Motion vector vision system integrity monitor | Electricity | 0 | Active |
| US11530918B2 | Integrity monitoring systems and methods for image sensors | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.