David Sturdevant
2Patents
1h-index
2Co-inventors
27Inventor score
Filing activity: Jan 28, 2005 → Jun 26, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7258953B2 | Multi-layer registration and dimensional test mark for scatterometrical measurement | Electricity | 1 | Expired |
| US7492049B2 | Multi-layer registration and dimensional test mark for scatterometrical measurement | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.