Dirk Hambach
2Patents
2h-index
7Co-inventors
33Inventor score
Filing activity: Feb 14, 2001 → Jun 10, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6859516B2 | Method for examining structures on a semiconductor substrate | Physics | 19 | Expired |
| US8203119B2 | Charged particle beam device with retarding field analyzer | Electricity | 17 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.