Don J. Weeks
9Patents
7h-index
12Co-inventors
52Inventor score
Filing activity: Mar 25, 1988 → Feb 28, 1995
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5018210A | Pattern comparator with substage illumination and polygonal data representation | Physics | 67 | Expired |
| US5001764A | Guardbands for pattern inspector | Physics | 60 | Expired |
| US5018212A | Defect area consolidation for pattern inspector | Physics | 19 | Expired |
| US5027132A | Position compensation of laser scan for stage movement | Electricity | 19 | Expired |
| US4969200A | Target autoalignment for pattern inspector or writer | Physics | 13 | Expired |
| US5592211A | Laser pattern/inspector with a linearly ramped chirp deflector | Physics | 12 | Expired |
| US5046110A | Comparator error filtering for pattern inspector | Physics | 11 | Expired |
| US4984282A | Parallel processing of reference and guardband data | Physics | 7 | Expired |
| US4991977A | Smoothing filter for stage position pulses | Physics | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.