Eishirou Take
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Jul 12, 1996 → Jul 12, 1996
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5801986A | Semiconductor memory device having both redundancy and test capability and method of manufacturing the same | Physics | 17 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.