Ely Pekel
4Patents
3h-index
5Co-inventors
33Inventor score
Filing activity: Dec 3, 1992 → Dec 3, 1992
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6294793A | High speed optical inspection apparatus for a transparent disk using gaussian distribution analysis and method therefor | Physics | 49 | Expired |
| US6262432A | High speed surface inspection optical apparatus for a reflective disk using gaussian distribution analysis and method therefor | Physics | 11 | Expired |
| US6252242A | High speed optical inspection apparatus using Gaussian distribution analysis and method therefore | Physics | 10 | Expired |
| US6255666A | High speed optical inspection apparatus for a large transparent flat panel using gaussian distribution analysis and method therefor | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.