Emil Berladsky
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Jan 26, 2006 → Jan 26, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7391510B2 | System and method for inspecting patterned devices having microscopic conductors | Physics | 4 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.