Enden David Liu
2Patents
2h-index
4Co-inventors
30Inventor score
Filing activity: Nov 20, 2013 → May 4, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9466463B1 | Charged particle beam substrate inspection using both vector and raster scanning | Electricity | 15 | Active |
| US9620332B1 | Charged particle beam substrate inspection using both vector and raster scanning | Electricity | 12 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.