Eric Dooryhe
1Patents
1h-index
7Co-inventors
25Inventor score
Filing activity: Mar 27, 2008 → Mar 27, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8155267B2 | Device for the X-ray analysis of a specimen, comprising an energy/angle-filtering diffraction analyser system | Physics | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.