Inventor · Allen, TX, US

Eric Poortinga

2Patents
2h-index
7Co-inventors
33Inventor score

Filing activity: Sep 9, 2003 → Aug 24, 2010

Most-cited inventions

PatentTitleAreaCited byStatus
US8913120B2 Method for emulation of a photolithographic process and mask inspection microscope for performing the method Physics 9 Active
US7049034B2 Photomask having an internal substantially transparent etch stop layer Physics 3 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.