Erwei Ma
1Patents
0h-index
6Co-inventors
19Inventor score
Filing activity: Jul 9, 2018 → Jul 9, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11081029B2 | Method for evaluating brightness measurement accuracy of Demura equipment | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.