Eva L. Benitez
2Patents
2h-index
7Co-inventors
30Inventor score
Filing activity: Jun 24, 2002 → Nov 18, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6833913B1 | Apparatus and methods for optically inspecting a sample for anomalies | Physics | 20 | Expired |
| US7012683B2 | Apparatus and methods for optically inspecting a sample for anomalies | Physics | 6 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.