Evan R. Mapoles
6Patents
3h-index
8Co-inventors
42Inventor score
Filing activity: Aug 6, 2001 → Dec 20, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7436503B1 | Dark field inspection apparatus and methods | Physics | 32 | Expired |
| US7106432B1 | Surface inspection system and method for using photo detector array to detect defects in inspection surface | Physics | 16 | Expired |
| US7106434B1 | Inspection tool | Physics | 10 | Expired |
| US7505619B2 | System and method for conducting adaptive fourier filtering to detect defects in dense logic areas of an inspection surface | Physics | 2 | Active |
| US6617555B1 | Imaging stabilization apparatus and method for high-performance optical systems | Physics | 1 | Expired |
| US6989515B2 | Imaging stabilization apparatus and method for high-performance optical systems | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.