Frank C. Leung
1Patents
1h-index
5Co-inventors
25Inventor score
Filing activity: Dec 4, 2002 → Dec 4, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6974653B2 | Methods for critical dimension and focus mapping using critical dimension test marks | Physics | 15 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.