Fred Duewer
9Patents
5h-index
6Co-inventors
56Inventor score
Filing activity: Jun 30, 2000 → Dec 4, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7550963B1 | Analytical scanning evanescent microwave microscope and control stage | Physics | 19 | Expired |
| US10912530B2 | Methods, systems, apparatuses, and computer programs for processing tomographic images | Physics | 10 | Active |
| US9872663B2 | Methods, systems, apparatuses, and computer programs for removing marker artifact contribution from a tomosynthesis dataset | Physics | 7 | Active |
| US11399792B2 | Methods, systems, apparatuses, and computer programs for processing tomographic images | Physics | 6 | Active |
| US11116466B2 | Methods, systems, apparatuses, and computer programs for processing tomographic images | Physics | 5 | Active |
| US11191508B2 | Methods, systems, apparatuses, and computer programs for processing tomographic images | Physics | 5 | Active |
| US11154267B2 | Methods, systems, apparatuses, and computer programs for processing tomographic images | Physics | 5 | Active |
| US8358141B2 | Analytical scanning evanescent microwave microscope and control stage | Physics | 2 | Active |
| US11166688B2 | Methods, systems, apparatuses, and computer programs for processing tomographic images | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.