Fu ZHANG
2Patents
2h-index
19Co-inventors
41Inventor score
Filing activity: Oct 5, 2000 → Mar 3, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6547637B1 | Chemical/mechanical polishing endpoint detection device and method | Performing Operations; Transporting | 10 | Expired |
| US10012576B2 | In-situ testing equipment for testing micromechanical properties of material in multi-load and multi-physical field coupled condition | Physics | 4 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.