Inventor · Holmdel, NJ, US

Gopala Rao

3Patents
1h-index
4Co-inventors
41Inventor score

Filing activity: May 14, 1991 → Dec 24, 2011

Most-cited inventions

PatentTitleAreaCited byStatus
USD340655S Combined X-ray quality assurance test phantom and support stand General 4 Expired
US8804558B2 Systems and methods for adjusting carrier quality metrics for intrinsic impariments Electricity 0 Active
US9560180B2 Systems and methods for adjusting carrier quality metrics for intrinsic impairments Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.