Greg Horner
1Patents
1h-index
5Co-inventors
25Inventor score
Filing activity: May 10, 2001 → May 10, 2001
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6759255B2 | Method and system for detecting metal contamination on a semiconductor wafer | Electricity | 16 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.