Gregory L. Koos
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Sep 25, 1989 → Sep 25, 1989
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5007741A | Methods and apparatus for detecting impurities in semiconductors | Physics | 8 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.