Haixing Zou
4Patents
4h-index
17Co-inventors
47Inventor score
Filing activity: Dec 22, 2004 → Oct 31, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7408641B1 | Measurement systems configured to perform measurements of a specimen and illumination subsystems configured to provide illumination for a measurement system | Physics | 12 | Expired |
| US7190441B1 | Methods and systems for preparing a sample for thin film analysis | Electricity | 6 | Expired |
| US7869040B1 | Measurement systems configured to perform measurements of a specimen and illumination subsystems configured to provide illumination for a measurement system | Physics | 5 | Active |
| US9970818B2 | Spatially resolved optical emission spectroscopy (OES) in plasma processing | Physics | 4 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.