Inventor · Tokyo, JP

Hanako AIKOH

2Patents
1h-index
9Co-inventors
30Inventor score

Filing activity: Sep 25, 2019 → Mar 31, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US11513084B2 Nondestructive inspecting system, and nondestructive inspecting method Physics 2 Active
US12366542B2 Nondestructive inspection system Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.